The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).

利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。

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Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.

用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。

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Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).

俄歇电子谱仪广泛地利用来确定固体表面的化学和电子结构(40 A)。

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